Method for forming a dielectric layer and related devices

A dielectric layer may be formed by depositing the dielectric layer to an intermediate thickness and applying a nitridation process to the dielectric layer of intermediate thickness. The dielectric layer may then be deposited to the final, desired thickness.

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Bibliographische Detailangaben
Hauptverfasser: YASUDA TETSUJI, KUSE RONALD J
Format: Patent
Sprache:eng
Schlagworte:
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Zusammenfassung:A dielectric layer may be formed by depositing the dielectric layer to an intermediate thickness and applying a nitridation process to the dielectric layer of intermediate thickness. The dielectric layer may then be deposited to the final, desired thickness.