Dual connection power line parameter analysis method and system
A method and apparatus is disclosed for determining the power line parameters of a system. Specifically, there is provided a method comprising perturbing a voltage waveform through a first connection, measuring a characteristic of the perturbation through a second connection, and calculating a line...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A method and apparatus is disclosed for determining the power line parameters of a system. Specifically, there is provided a method comprising perturbing a voltage waveform through a first connection, measuring a characteristic of the perturbation through a second connection, and calculating a line impedance based on the characteristic of the perturbation. |
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