Fast time-of-flight mass spectrometer with improved data acquisition system

Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.

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Bibliographische Detailangaben
Hauptverfasser: SCHULTZ J. A, VAUGHN VALERIE E, FUHRER KATRIN, ULRICH STEVEN, BURTON WILLIAM, GONIN MARC, EGAN THOMAS F
Format: Patent
Sprache:eng
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Zusammenfassung:Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.