Leakage-tolerant dynamic wide-nor circuit structure

One embodiment of the present invention provides a circuit which blocks a keeper from interfering with a dynamic node during an evaluation phase for a dynamic wide-NOR structure. The circuit contains a precharge device which is coupled to the dynamic node. The precharge device precharges the dynamic node during a precharge phase. The circuit also contains a plurality of parallel pull-down transistors which are coupled to the dynamic node. The pull-down transistors conditionally discharge the dynamic node during the evaluate phase. The keeper sustains a precharged value on the dynamic node, thereby preventing a false evaluation caused by a leakage current through the parallel pull-down transistors. In addition, the circuit contains a feedback gating device which is coupled between the keeper and the dynamic node. During the evaluation phase, the feedback gating device blocks the keeper, so that the parallel pull-down transistors can discharge the dynamic node without interference from the keeper.