Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate

Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate

Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a su...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SEKAS MARK, LAFLEUR PATRICIA A, SOTTERY JOHN P
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate, and pass through a second polarized filter arranged in a cross polar arrangement with respect to the first polarized filter. Digital data is determined from the captured electromagnetic waves. Based on the digital data, the customer is given certain choices and/or informed of certain personal care product recommendations.