OPTICAL WAVELENGTH INTERROGATOR

An optical wavelength readout system for application in optical sensing systems is disclosed. The system includes a Master unit including a wavelength swept optical source for launching light into a string of optical sensors, and a detection and processing unit for detecting and processing the light...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	NAKSTAD HILDE, KRINGLEBOTN JON T, RONNEKLEIV ERLEND, THINGBO DAG
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	An optical wavelength readout system for application in optical sensing systems is disclosed. The system includes a Master unit including a wavelength swept optical source for launching light into a string of optical sensors, and a detection and processing unit for detecting and processing the light emitted by the source. The system also includes a Slave unit including a light coupling device for coupling light from the light source into the string of sensors and for coupling light reflected from the string of sensors to a detection and processing unit arranged to detect and process the reflected light. The Master unit includes a wavelength reference unit adapted to make a reference signal available to other parts of the sensing system. The reference signal represents a generally exact relation between the wavelength of the light emitted from the source and time.