Sapphire substrate, epitaxial substrate and semiconductor device

An epitaxial substrate for manufacturing field effect transistor (FET) that has heterojunction structure consisting of at least a channel layer made of gallium nitride or gallium indium nitride and a barrier layer made of aluminum gallium nitride formed successively on the principal plane of the sap...

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Hauptverfasser: IMURA MASATAKA, TSUDA MICHINOBU, AMANO HIROSHI, IWAYA MOTOAKI, KAMIYAMA SATOSHI, AKASAKI ISAMU, HONSHIO AKIRA
Format: Patent
Sprache:eng
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Zusammenfassung:An epitaxial substrate for manufacturing field effect transistor (FET) that has heterojunction structure consisting of at least a channel layer made of gallium nitride or gallium indium nitride and a barrier layer made of aluminum gallium nitride formed successively on the principal plane of the sapphire substrate, wherein the principal plane of the sapphire substrate semiconductor is inclined from (01-12) plane toward (0001) plane by an off-angle alpha that is in a range of 0°