Method to provide a layer with uniform etch characteristics

The present invention includes a method and a composition to form a layer on a substrate having uniform etch characteristics. To that end, the method includes controlling variations in the characteristics of a solid layer, such etch characteristics over the area of the solid layer as a function of t...

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Bibliographische Detailangaben
Hauptverfasser: XU FRANK Y, MARTIN WESLEY, LAD PANKAJ B, WANG DAVID C, WATTS MICHAEL P.C, STACEY NICHOLAS A, MACKAY CHRISTOPHER J, TRUSKETT VAN N, FLETCHER EDWARD B, MCMACKIN IAN M
Format: Patent
Sprache:eng
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Zusammenfassung:The present invention includes a method and a composition to form a layer on a substrate having uniform etch characteristics. To that end, the method includes controlling variations in the characteristics of a solid layer, such etch characteristics over the area of the solid layer as a function of the relative rates of evaporation of the liquid components that comprise the composition from which the solid layer is formed.