Method for operating an X-ray analysis apparatus with two-dimensional array detector and X-ray analysis apparatus for carrying out the method

A method for operating an X-ray analysis device with a source ( 17 ) for X-ray radiation, an object ( 19 ) under investigation which is irradiated with X-ray radiation, and a planar two-dimensional array detector with pixel elements ( 7 ) for spatially resolved detection of the X-ray radiation emitt...

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Bibliographische Detailangaben

Hauptverfasser:	JACOB MICHAEL, GERNDT EKKEHARD
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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