Asynchronous calibration and correction of a solid-state detector

A system and method for asynchronous calibration of a solid-state detector are provided. A first offset is obtained with a first frame interval. A second offset image is obtained with a second frame interval that is shorter than the first frame interval. A third offset image is obtained with a third...

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Bibliographische Detailangaben
Hauptverfasser:	KUMP KENNETH S, ODOGBA JIBRIL
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CALCULATING COMPUTING COUNTING CRYPTOGRAPHY DISPLAY EDUCATION IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS SEALS
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Beschreibung
Zusammenfassung:	A system and method for asynchronous calibration of a solid-state detector are provided. A first offset is obtained with a first frame interval. A second offset image is obtained with a second frame interval that is shorter than the first frame interval. A third offset image is obtained with a third frame interval that is longer than the first frame interval. The first offset image is offset with each of the second offset image and the third offset image to produce offset comparison images. Pixels in the offset comparison images with an intensity value that exceeds an asynchronous threshold intensity value are identified as asynchronous bad pixels and added to a bad pixel map. Subsequently acquired x-ray images are offset with corresponding offset images. The bad pixel map is used to identify asynchronous bad pixels in the displayed images.