Resistance value calculation method

The resistance value of a supply line (Rline), the resistance value of a decoupling capacitor (Rcap), and the resistance value of a transistor (Rmos) are separately calculated from mask layout information 31 of a semiconductor integrated circuit. The resistance value between external terminals (Ri)...

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Bibliographische Detailangaben
Hauptverfasser:	SHIMAZAKI KENJI, HIRANO SHOZO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	The resistance value of a supply line (Rline), the resistance value of a decoupling capacitor (Rcap), and the resistance value of a transistor (Rmos) are separately calculated from mask layout information 31 of a semiconductor integrated circuit. The resistance value between external terminals (Ri) is calculated from the resistance value Rline, the resistance value Rcap, and the resistance value Rmos.