Systems and methods for defining acceptable device interconnect, and for evaluating device interconnect

In a method for evaluating device interconnect, test data values corresponding to each of a number of interconnects of a device under test (DUT) are obtained. For a given interconnect of the DUT, one or more relationships between two or more of the test data values are evaluated to determine whether the given interconnect is acceptable. In a corresponding method for defining acceptable device interconnect, a plurality of known-good test data values are generated. The known-good test data values correspond to each of a number of interconnects for a device. For a given interconnect of the device, one or more relationships between two or more of the test data values are identified. A factor in identifying the relationships is a likelihood that one or more of the identified relationships will be impacted by the quality of the given interconnect. The relationships between test data values are quantified using the known-good test data values. The identified and quantified relationships are then used to define a function for evaluating the interconnect of a DUT.