Device to measure the solidification properties of a liquid film and method therefor

The present invention is directed to an apparatus and a method for monitoring the viscoelastic properties, of a liquid film (e.g. coating). The apparatus comprises a substrate supporting a liquid film, a probe to contact the liquid film, means for effecting relative movement between the probe and the substrate and means for monitoring the resistance to movement of the probe in contact with the film to obtain a measurement of the solidification properties of the liquid film. This apparatus and method are particularly useful in comparing the effects of film formers, viscosity modifiers, solvents, and minerals on the drying rate of coatings at the early stage of film formation.