Atomic laminates for diffusion barrier applications

The present invention relates to a very thin multilayer diffusion barrier for a semiconductor device and fabrication method thereof. The multilayer diffusion barrier according to the present invention is fabricated by forming a very thin, multilayer diffusion barrier composed of even thinner sub-lay...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KIM HYUNGJUN, ROSSNAGEL STEPHEN M, BARMAK KATAYUN, NOYAN ISMAIL C
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present invention relates to a very thin multilayer diffusion barrier for a semiconductor device and fabrication method thereof. The multilayer diffusion barrier according to the present invention is fabricated by forming a very thin, multilayer diffusion barrier composed of even thinner sub-layers, where the sub-layers are only a few atoms thick. The present invention provides a diffusion barrier layer for a semiconductor device which is in a substantially amorphous state and thermodynamically stable, even at high temperatures.