Method and apparatus for internal feature reconstruction

Method and apparatus for internal feature reconstruction

A method for reconstructing internal surface geometry of a part includes registering a thickness map for the part with external surface data for the part. The thickness map has a number of thickness data. Internal surface data is generated using the thickness map and the external surface data to rec...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: REBELLO ALEXANDER BERNARD FLAVIAN, HOWARD DONALD ROBERT, HARDING KEVIN GEORGE
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method for reconstructing internal surface geometry of a part includes registering a thickness map for the part with external surface data for the part. The thickness map has a number of thickness data. Internal surface data is generated using the thickness map and the external surface data to reconstruct the internal surface geometry.