Apparatus and method for coverage directed test

A Bayesian network correlating coverage data and input data to a test verification system for coverage directed test generation (CDG) of a device under test. In one embodiment, the Bayesian network is part of a CDG engine which also includes a data analyzer which analyzes coverage data from a current test run of a test verification system and from previous test runs to determine which coverage events from a coverage model have occurred therein, at what frequency and which ones have not yet occurred, a coverage model listing coverage events which define the goal of the test verification system and a task manager coupled to the data analyzer and the Bayesian network which refers to the coverage model and queries the Bayesian network to produce input data to achieve desired coverage events.