Tool and fixture for measuring mechanical and electromechanical properties for IC assemblies and features

Disclosed are the methods and tools to reliably and accurately predict and model the strength of the individual features and structures of semiconductor components. By modifying the traditional anvil/pyramidal indentors on a hardness tester, an improved method has been created to evaluate the mechan...

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Bibliographische Detailangaben

1. Verfasser:	COLLIER TERENCE QUINTIN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LINE CONNECTORS MEASURING PHYSICS TESTING
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