Fast characterizing method for triboelectrical properties

An apparatus is disclosed for evaluating the triboelectrical properties of at least two samples, comprising a grounded means (1) for holding a material in sheet form comprising a support provided on at least one surface thereof with at least two samples each in at least one predefined region thereof...

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Bibliographische Detailangaben
Hauptverfasser:	HUYGELEN DIRK, DIERCKX JAN, DESIE GUIDO, NEIRINCK FILIP, MUYS BAVO
Format:	Patent
Sprache:	eng
Schlagworte:	CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOIDCHEMISTRY CHEMISTRY COMBINATORIAL CHEMISTRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING METALLURGY NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TESTING THEIR RELEVANT APPARATUS TRANSPORTING
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Beschreibung
Zusammenfassung:	An apparatus is disclosed for evaluating the triboelectrical properties of at least two samples, comprising a grounded means (1) for holding a material in sheet form comprising a support provided on at least one surface thereof with at least two samples each in at least one predefined region thereof; a charging means (4) for tribocharging the at least two samples; and a means (7) for measuring an electrical property of the at least two samples. A method for evaluating an array of multiple samples on their triboelectrical properties with such an apparatus is also disclosed.