Method of production, method of inspection, and method of use of scanning probe microscope probe

A method of production of a scanning probe microscope probe provided with a sharp head made of a single wall carbon nanotube comprising imparting a catalyst metal to a tip of probe body, then irradiating the catalyzed part of the tip of the probe body by an arc discharge caused between needle shaped...

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Bibliographische Detailangaben
Hauptverfasser:	TAKAZAWA NOBUAKI, SHIMAZAKI RYUJI
Format:	Patent
Sprache:	eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] CHEMISTRY COMPOUNDS THEREOF GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INORGANIC CHEMISTRY MEASURING METALLURGY NON-METALLIC ELEMENTS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS TESTING
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Beschreibung
Zusammenfassung:	A method of production of a scanning probe microscope probe provided with a sharp head made of a single wall carbon nanotube comprising imparting a catalyst metal to a tip of probe body, then irradiating the catalyzed part of the tip of the probe body by an arc discharge caused between needle shaped carbon electrodes in an inert gas atmosphere in a scanning probe microscope so as to grow a single wall carbon nanotube at the catalyzed part, and a method of inspection and method of use of the same.