Modeling substrate noise coupling using scalable parameters

Methods and apparatus for substrate modeling are disclosed. In one disclosed method, for example, the substrate modeling comprises determining scalable Z parameters associated with at least two substrate contacts, constructing a matrix of the scalable Z parameters for the at least two substrate contacts, and calculating an inverse of the matrix to determine resistance values associated with the at least two substrate contacts. Computer-readable media containing computer-executable instructions for causing a computer system to perform any of the described methods are also disclosed.