Mask compliance testing using bit error ratio measurements

Mask compliance of a digital signal from a reference device is determined. Bit error rates for first sampling points for a low mask region are detected. The bit error rates for the first sampling points are averaged to produce an average low mask region error rate. Bit error rates for second samplin...

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Bibliographische Detailangaben
1. Verfasser:	JUNGERMAN ROGER LEE
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
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Beschreibung
Zusammenfassung:	Mask compliance of a digital signal from a reference device is determined. Bit error rates for first sampling points for a low mask region are detected. The bit error rates for the first sampling points are averaged to produce an average low mask region error rate. Bit error rates for second sampling points for a high mask region are detected. The bit error rates for the second sampling points are averaged to produce an average high mask region error rate.