Optical device and optical process for particle displacement

The invention relates to an optical device and an optical process for displacement of particles (P). The device comprises a substrate (6) on which at least one strip (5) of at least one thin layer is deposited, the strip (5) having an optical thickness gradient along an axis such that the displaceme...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	CHATON PATRICK, GETIN STEPHANE
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS DEVICES USING STIMULATED EMISSION ELECTRICITY GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING
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Beschreibung
Zusammenfassung:	The invention relates to an optical device and an optical process for displacement of particles (P). The device comprises a substrate (6) on which at least one strip (5) of at least one thin layer is deposited, the strip (5) having an optical thickness gradient along an axis such that the displacement of a particle (P) takes place along this axis when an electromagnetic wave (L) illuminates the device. The invention is applicable to sorting and/or analysis of particles.