Evaluating data handling devices by means of a marker impurity
The present invention is a method for evaluating a multiplicity of data handling devices each having a sealed chamber with several interior surfaces. It uses an impurity chamber containing thousands of dispersed gas-borne particles that each contain a marker impurity that is substantially absent fro...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The present invention is a method for evaluating a multiplicity of data handling devices each having a sealed chamber with several interior surfaces. It uses an impurity chamber containing thousands of dispersed gas-borne particles that each contain a marker impurity that is substantially absent from all of the interior surfaces of at least one of the devices. That device is tested for vulnerability to external dust using the marker impurity. |
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