Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit

The integrated circuit has a test circuit, which is connected to an input terminal of the integrated circuit via a line connection. An isolating device is provided between an input terminal of the test circuit in order to completely isolate the line connection between the test circuit and the input...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	SCHNABEL RAINER FLORIAN
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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