Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit

Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit

The integrated circuit has a test circuit, which is connected to an input terminal of the integrated circuit via a line connection. An isolating device is provided between an input terminal of the test circuit in order to completely isolate the line connection between the test circuit and the input...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: SCHNABEL RAINER FLORIAN
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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Beschreibung
Zusammenfassung:The integrated circuit has a test circuit, which is connected to an input terminal of the integrated circuit via a line connection. An isolating device is provided between an input terminal of the test circuit in order to completely isolate the line connection between the test circuit and the input terminal after the test circuit has performed a test procedure.