Multi dimensional dither technique for optical element alignment

Multi dimensional dither technique for optical element alignment

The subject invention uses a dither technique and a Discrete Fourier Transform to simultaneously align optical components along two axes orthogonal to the optic axis. The dither technique and the magnitude of the transmitted light are used to detect the misalignment in both directions simultaneously...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ANDERSON NATHANIEL C, BOWEN ARLEN J, STICH MICHAEL C
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The subject invention uses a dither technique and a Discrete Fourier Transform to simultaneously align optical components along two axes orthogonal to the optic axis. The dither technique and the magnitude of the transmitted light are used to detect the misalignment in both directions simultaneously, and the Discrete Fourier Transform is used to detect the size and direction of the misalignment.