Tracer device

A tracer device having a tracer arm is mounted in an axial guide and is movable back and forth in the x direction while measuring the path, and a tracer head is mounted at the free area of the tracer arm, is in contact with the surface of a part during a measurement and, during its travel in the x d...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	REGITZ THILO
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A tracer device having a tracer arm is mounted in an axial guide and is movable back and forth in the x direction while measuring the path, and a tracer head is mounted at the free area of the tracer arm, is in contact with the surface of a part during a measurement and, during its travel in the x direction, is deflected by the surface contours in a z direction that is perpendicular to the x direction, and having an analyzer device for detecting and analyzing the deflections in the z direction as a function of the path in the x direction. An easy to handle, compact design is provided since the front section of the tracer arm, which is rigid per se, is provided with a tracer leg that forms an articulated link of the tracer head to the tracer arm, and a measuring element that detects the deflection in the z direction is arranged on the tracer leg.