Quality review method for optical components using a fast system performance characterization
A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase phi of the optical component, wherein the step of measuring comprises indirectly measuring the...
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creator | BRENNAN JAMES F SINHA PRANAY G PORQUE JEROME C FAN XUDONG MATTHEWS MICHAEL R |
description | A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase phi of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase phi of the optical component using a scanning laser having a scanning step size DELTAomega and a modulation frequency omegam such that DELTAomega/omegam |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2003063286A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2003063286A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2003063286A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQANAuDqL-w4GzEBsoriKKq6ijlCNebSDJhdxVqV-vgx_g9JY3rW6nAYPXEQo9Pb0gkvZ8h44LcFbvMIDjmDlRUoFBfHoAQoeiIKMoRchUvjticgSux4JOqfg3quc0ryYdBqHFz1m1POwvu-OKMrckGR0l0vZ6ro2xprH1ptmu7X_rA2M_PiA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Quality review method for optical components using a fast system performance characterization</title><source>esp@cenet</source><creator>BRENNAN JAMES F ; SINHA PRANAY G ; PORQUE JEROME C ; FAN XUDONG ; MATTHEWS MICHAEL R</creator><creatorcontrib>BRENNAN JAMES F ; SINHA PRANAY G ; PORQUE JEROME C ; FAN XUDONG ; MATTHEWS MICHAEL R</creatorcontrib><description>A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase phi of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase phi of the optical component using a scanning laser having a scanning step size DELTAomega and a modulation frequency omegam such that DELTAomega/omegam<=2. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency co is constructed where H(omega)=R(omega)exp[jphi(omega)], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.</description><edition>7</edition><language>eng</language><subject>MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030403&DB=EPODOC&CC=US&NR=2003063286A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030403&DB=EPODOC&CC=US&NR=2003063286A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BRENNAN JAMES F</creatorcontrib><creatorcontrib>SINHA PRANAY G</creatorcontrib><creatorcontrib>PORQUE JEROME C</creatorcontrib><creatorcontrib>FAN XUDONG</creatorcontrib><creatorcontrib>MATTHEWS MICHAEL R</creatorcontrib><title>Quality review method for optical components using a fast system performance characterization</title><description>A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase phi of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase phi of the optical component using a scanning laser having a scanning step size DELTAomega and a modulation frequency omegam such that DELTAomega/omegam<=2. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency co is constructed where H(omega)=R(omega)exp[jphi(omega)], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.</description><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAuDqL-w4GzEBsoriKKq6ijlCNebSDJhdxVqV-vgx_g9JY3rW6nAYPXEQo9Pb0gkvZ8h44LcFbvMIDjmDlRUoFBfHoAQoeiIKMoRchUvjticgSux4JOqfg3quc0ryYdBqHFz1m1POwvu-OKMrckGR0l0vZ6ro2xprH1ptmu7X_rA2M_PiA</recordid><startdate>20030403</startdate><enddate>20030403</enddate><creator>BRENNAN JAMES F</creator><creator>SINHA PRANAY G</creator><creator>PORQUE JEROME C</creator><creator>FAN XUDONG</creator><creator>MATTHEWS MICHAEL R</creator><scope>EVB</scope></search><sort><creationdate>20030403</creationdate><title>Quality review method for optical components using a fast system performance characterization</title><author>BRENNAN JAMES F ; SINHA PRANAY G ; PORQUE JEROME C ; FAN XUDONG ; MATTHEWS MICHAEL R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2003063286A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>BRENNAN JAMES F</creatorcontrib><creatorcontrib>SINHA PRANAY G</creatorcontrib><creatorcontrib>PORQUE JEROME C</creatorcontrib><creatorcontrib>FAN XUDONG</creatorcontrib><creatorcontrib>MATTHEWS MICHAEL R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BRENNAN JAMES F</au><au>SINHA PRANAY G</au><au>PORQUE JEROME C</au><au>FAN XUDONG</au><au>MATTHEWS MICHAEL R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Quality review method for optical components using a fast system performance characterization</title><date>2003-04-03</date><risdate>2003</risdate><abstract>A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase phi of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase phi of the optical component using a scanning laser having a scanning step size DELTAomega and a modulation frequency omegam such that DELTAomega/omegam<=2. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency co is constructed where H(omega)=R(omega)exp[jphi(omega)], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | Quality review method for optical components using a fast system performance characterization |
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