Quality review method for optical components using a fast system performance characterization

A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase phi of the optical component, wherein the step of measuring comprises indirectly measuring the...

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Bibliographische Detailangaben
Hauptverfasser: BRENNAN JAMES F, SINHA PRANAY G, PORQUE JEROME C, FAN XUDONG, MATTHEWS MICHAEL R
Format: Patent
Sprache:eng
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Zusammenfassung:A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase phi of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase phi of the optical component using a scanning laser having a scanning step size DELTAomega and a modulation frequency omegam such that DELTAomega/omegam