Optical path structure for open path emissions sensing with opposed sources

Optical path structure for open path emissions sensing with opposed sources

An optical system for a gas component analysis includes an emitter for emitting first light beam having a first spectrum, a second emitter for emitting a second light beam at a second spectrum, a first receiver for receiving the first light beam, and a second receiver for receiving the second light...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: RENDAHL CRAIG S, DIDOMENICO JOHN, GENTALA ROBERT A
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An optical system for a gas component analysis includes an emitter for emitting first light beam having a first spectrum, a second emitter for emitting a second light beam at a second spectrum, a first receiver for receiving the first light beam, and a second receiver for receiving the second light beam.