Apparatus and method for testing semiconductor devices

There is disclosed an apparatus for supporting singulated electronic devices during a testing operation, comprising: a main body and a support member, wherein said support member is made of non-conducting high-resistivity material and comprises a plurality of recesses, each said recess being adapted...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TSUI CHING MAN STANLEY, CHOW ERIC, BILAN CURITO M
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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