Phosphorus dopant control in low-temperature Si and SiGe epitaxy

A method of manufacturing a semiconductor device comprising the step of epitaxially growing of an n-type doped layer of a semiconductor material using an n-type dopant gas, the growth process being performed at a pressure higher than 2.66x104 Pa.

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1. Verfasser: DE BOER WIEBE BARTELD
Format: Patent
Sprache:eng
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Zusammenfassung:A method of manufacturing a semiconductor device comprising the step of epitaxially growing of an n-type doped layer of a semiconductor material using an n-type dopant gas, the growth process being performed at a pressure higher than 2.66x104 Pa.