Optical position sensor and position determination method

Optical position sensor and position determination method

A method of position measurement by processing at least two phase displaced signals and by selecting one signal for position measurement at a given position point. Specifically, the two phase displaced signals are quadrature signals and the selected signal has a more linear waveform slope relative t...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CARLIALE JEFFREY, KAPLAN ALVARO, KIRKMAN JOHN M
Format: Patent
Sprache:eng
Schlagworte:
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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Beschreibung
Zusammenfassung:A method of position measurement by processing at least two phase displaced signals and by selecting one signal for position measurement at a given position point. Specifically, the two phase displaced signals are quadrature signals and the selected signal has a more linear waveform slope relative to time at a given position point than the non-selected signal.