Linked cameras and processors for imaging system

An inspection system for identifying defects on the surface of an item includes an information processor mounted on a base assembly. A tray is used to move the item to an inspection station on the base assembly, and an illuminator is provided at the inspection station to illuminate the item from different visual perspectives. Importantly, the illuminator includes a plurality of different light sources. An N number of cameras and an M number of image processors are operated in concert to collect image data from the illuminated item. This image data is then analyzed using the image processors to compare the image data with a template image to detect defects in the item. In the operation of the inspection system, the tray, the illuminator, the cameras and the image processors are all centrally controlled and coordinated by an central information processor.