Duty cycle monitoring method and apparatus for memory interface

Disclosed herein are a duty cycle monitoring method and apparatus for a memory interface, including receiving a clock signal as input and generating a first delay time offset and a second delay time offset, receiving the clock signal and the first delay time offset and then outputting a first delaye...

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Bibliographische Detailangaben
Hauptverfasser: Park, Su-Jin, Jeon, Young-Deuk, Kwon, Young-Su, Cho, Min-Hyung, Choi, Jae-Woong, Kim, Yi-Gyeong
Format: Patent
Sprache:eng
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Zusammenfassung:Disclosed herein are a duty cycle monitoring method and apparatus for a memory interface, including receiving a clock signal as input and generating a first delay time offset and a second delay time offset, receiving the clock signal and the first delay time offset and then outputting a first delayed signal, receiving the first delayed signal and the second delay time offset and then outputting a second delayed signal, receiving the clock signal and the second delayed signal and then outputting a delay value corresponding to a half-period of the clock signal, and monitoring, based on the first delayed signal, whether a duty cycle of the clock signal conforms to a duty cycle specification.