Linear temperature calibration compensation for spectrometer systems

In an example method, light is emitted towards a sample region, and sample light is received at an interferometer. A subset of the sample light is transmitted from the interferometer to a detector. Transmitting the subset of the sample light includes determining a reference voltage corresponding to...

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Bibliographische Detailangaben
1. Verfasser: Miguel Sánchez, Javier
Format: Patent
Sprache:eng
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Zusammenfassung:In an example method, light is emitted towards a sample region, and sample light is received at an interferometer. A subset of the sample light is transmitted from the interferometer to a detector. Transmitting the subset of the sample light includes determining a reference voltage corresponding to the range of wavelengths of the subset of sample light, and a reference temperature. Transmitting the subset of sample light also includes determining a temperature of an environment, determining a bias voltage corresponding to a difference between the reference temperature and the temperature of the environment, and applying, to the interferometer, an input voltage corresponding to the sum of the reference voltage and the bias voltage. The subset of the sample light is measured by the detector, and a spectral distribution of light is determined based on the measurements.