Temperature detection circuit

A temperature detection circuit (1) includes a first transistor (Q1) of a bipolar type, and a second transistor (Q2) of a bipolar type, wherein the first transistor (Q1) and the second transistor (Q2) form a current mirror circuit (10), and the temperature of the amplifier circuit (30) is detected b...

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Hauptverfasser: Kawano, Takayuki, Yamashiro, Hideyo, Suzuki, Nobukazu, Sugimoto, Yasutaka
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creator Kawano, Takayuki
Yamashiro, Hideyo
Suzuki, Nobukazu
Sugimoto, Yasutaka
description A temperature detection circuit (1) includes a first transistor (Q1) of a bipolar type, and a second transistor (Q2) of a bipolar type, wherein the first transistor (Q1) and the second transistor (Q2) form a current mirror circuit (10), and the temperature of the amplifier circuit (30) is detected based on a temperature change of the first transistor (Q1) and the second transistor (Q2).
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Yamashiro, Hideyo ; Suzuki, Nobukazu ; Sugimoto, Yasutaka</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US12152946B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Kawano, Takayuki</creatorcontrib><creatorcontrib>Yamashiro, Hideyo</creatorcontrib><creatorcontrib>Suzuki, Nobukazu</creatorcontrib><creatorcontrib>Sugimoto, Yasutaka</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kawano, Takayuki</au><au>Yamashiro, Hideyo</au><au>Suzuki, Nobukazu</au><au>Sugimoto, Yasutaka</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Temperature detection circuit</title><date>2024-11-26</date><risdate>2024</risdate><abstract>A temperature detection circuit (1) includes a first transistor (Q1) of a bipolar type, and a second transistor (Q2) of a bipolar type, wherein the first transistor (Q1) and the second transistor (Q2) form a current mirror circuit (10), and the temperature of the amplifier circuit (30) is detected based on a temperature change of the first transistor (Q1) and the second transistor (Q2).</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
title Temperature detection circuit
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