Kirigami-based sensor devices and systems

A sensor device includes a substrate having a plurality of cuts through the substrate to define a set of substrate sections, the substrate being flexible, and a plurality of sensor structures supported by the substrate, each sensor structure of the plurality of sensor structures being disposed at a...

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Bibliographische Detailangaben
Hauptverfasser:	Shtein, Max, Evke, Erin, Shteyn, Eugene
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A sensor device includes a substrate having a plurality of cuts through the substrate to define a set of substrate sections, the substrate being flexible, and a plurality of sensor structures supported by the substrate, each sensor structure of the plurality of sensor structures being disposed at a respective substrate section of the set of substrate sections. Deformation of the substrate deforms each respective substrate section of the set of substrate sections such that each respective substrate section is deformed to a respective extent. Each sensor structure of the plurality of sensor structures is configured to provide an indication of the respective extent of the deformation.