Magnetoresistance memory device
In general, according to one embodiment, a magnetoresistance memory device includes: a first ferromagnetic layer; an insulating layer above the first ferromagnetic layer; a second ferromagnetic layer above the insulating layer; a third ferromagnetic layer above the second ferromagnetic layer; and a...
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creator | Jung, Jin Won Sawada, Kazuya Kwak, Jung Hyeok Kitagawa, Eiji Oikawa, Tadaaki Eeh, Young Min Isoda, Taiga |
description | In general, according to one embodiment, a magnetoresistance memory device includes: a first ferromagnetic layer; an insulating layer above the first ferromagnetic layer; a second ferromagnetic layer above the insulating layer; a third ferromagnetic layer above the second ferromagnetic layer; and a fourth ferromagnetic layer above the third ferromagnetic layer. The third ferromagnetic layer includes an oxide of an alloy including iron. The fourth ferromagnetic layer includes iron and a 5d transition metal. |
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The third ferromagnetic layer includes an oxide of an alloy including iron. The fourth ferromagnetic layer includes iron and a 5d transition metal.</description><language>eng</language><subject>ELECTRICITY ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241022&DB=EPODOC&CC=US&NR=12125510B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241022&DB=EPODOC&CC=US&NR=12125510B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Jung, Jin Won</creatorcontrib><creatorcontrib>Sawada, Kazuya</creatorcontrib><creatorcontrib>Kwak, Jung Hyeok</creatorcontrib><creatorcontrib>Kitagawa, Eiji</creatorcontrib><creatorcontrib>Oikawa, Tadaaki</creatorcontrib><creatorcontrib>Eeh, Young Min</creatorcontrib><creatorcontrib>Isoda, Taiga</creatorcontrib><title>Magnetoresistance memory device</title><description>In general, according to one embodiment, a magnetoresistance memory device includes: a first ferromagnetic layer; an insulating layer above the first ferromagnetic layer; a second ferromagnetic layer above the insulating layer; a third ferromagnetic layer above the second ferromagnetic layer; and a fourth ferromagnetic layer above the third ferromagnetic layer. The third ferromagnetic layer includes an oxide of an alloy including iron. The fourth ferromagnetic layer includes iron and a 5d transition metal.</description><subject>ELECTRICITY</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD3TUzPSy3JL0otziwuScxLTlXITc3NL6pUSEkty0xO5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpQO3xocGGRoZGpqaGBk5GxsSoAQBXxyVh</recordid><startdate>20241022</startdate><enddate>20241022</enddate><creator>Jung, Jin Won</creator><creator>Sawada, Kazuya</creator><creator>Kwak, Jung Hyeok</creator><creator>Kitagawa, Eiji</creator><creator>Oikawa, Tadaaki</creator><creator>Eeh, Young Min</creator><creator>Isoda, Taiga</creator><scope>EVB</scope></search><sort><creationdate>20241022</creationdate><title>Magnetoresistance memory device</title><author>Jung, Jin Won ; Sawada, Kazuya ; Kwak, Jung Hyeok ; Kitagawa, Eiji ; Oikawa, Tadaaki ; Eeh, Young Min ; Isoda, Taiga</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US12125510B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>ELECTRICITY</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>Jung, Jin Won</creatorcontrib><creatorcontrib>Sawada, Kazuya</creatorcontrib><creatorcontrib>Kwak, Jung Hyeok</creatorcontrib><creatorcontrib>Kitagawa, Eiji</creatorcontrib><creatorcontrib>Oikawa, Tadaaki</creatorcontrib><creatorcontrib>Eeh, Young Min</creatorcontrib><creatorcontrib>Isoda, Taiga</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jung, Jin Won</au><au>Sawada, Kazuya</au><au>Kwak, Jung Hyeok</au><au>Kitagawa, Eiji</au><au>Oikawa, Tadaaki</au><au>Eeh, Young Min</au><au>Isoda, Taiga</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Magnetoresistance memory device</title><date>2024-10-22</date><risdate>2024</risdate><abstract>In general, according to one embodiment, a magnetoresistance memory device includes: a first ferromagnetic layer; an insulating layer above the first ferromagnetic layer; a second ferromagnetic layer above the insulating layer; a third ferromagnetic layer above the second ferromagnetic layer; and a fourth ferromagnetic layer above the third ferromagnetic layer. The third ferromagnetic layer includes an oxide of an alloy including iron. The fourth ferromagnetic layer includes iron and a 5d transition metal.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | ELECTRICITY INFORMATION STORAGE PHYSICS STATIC STORES |
title | Magnetoresistance memory device |
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