Semiconductor device and method for fabricating the same

A method for fabricating a semiconductor device includes the steps of forming a first inter-metal dielectric (IMD) layer on a substrate, forming a first trench and a second trench in the first IMD layer, forming a bottom electrode in the first trench and the second trench, forming a ferroelectric (F...

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Bibliographische Detailangaben
Hauptverfasser: Tsai, Shih-Hung, Lin, Chun-Hsien, Hsieh, Po-Kuang
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for fabricating a semiconductor device includes the steps of forming a first inter-metal dielectric (IMD) layer on a substrate, forming a first trench and a second trench in the first IMD layer, forming a bottom electrode in the first trench and the second trench, forming a ferroelectric (FE) layer on the bottom electrode, and then forming a top electrode on the FE layer to form a ferroelectric random access memory (FeRAM).