Method for generating data for particle analysis, program for generating data for particle analysis, and device for generating data for particle analysis

Method for generating data for particle analysis, program for generating data for particle analysis, and device for generating data for particle analysis

In relation to application of artificial intelligence to image analysis of particles, to make it possible to provide data for machine learning corresponding to user demands while making it possible to reduce, as much as possible, man-hours taken to, for example, prepare vast amounts of actual image...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Koshikawa, Hiroyuki, Matsuo, Kosuke, Akiyama, Hisashi, Mori, Tetsuya, Katsuda, Toshihiro, Nakatani, Hitoshi
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:In relation to application of artificial intelligence to image analysis of particles, to make it possible to provide data for machine learning corresponding to user demands while making it possible to reduce, as much as possible, man-hours taken to, for example, prepare vast amounts of actual image data obtained by actually capturing images of particles, the present invention generates virtual particle image data, which is image data of a virtual particle, on the basis of a predetermined condition, generates label data corresponding to the virtual particle, and associates the virtual particle image data with the label data.