Group III nitride device and method of fabricating a Group III nitride-based device

In an embodiment, a Group III nitride-based transistor device includes a first passivation layer arranged on a first major surface of a Group III nitride-based layer, a second passivation layer arranged on the first passivation layer, a source ohmic contact, a drain ohmic contact and a gate position...

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Bibliographische Detailangaben
Hauptverfasser: Twynam, John, Birner, Albert, Brech, Helmut
Format: Patent
Sprache:eng
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