Tungsten deposition

Described herein are methods of filling features with tungsten and related apparatus. The methods described herein involve deposition of a tungsten nucleation layer prior to deposition of a bulk layer. The methods involve multiple atomic layer deposition (ALD) cycles. According to various embodiment...

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Bibliographische Detailangaben
Hauptverfasser: Tjokro, Novy, Nannapaneni, Pragna, Gopinath, Sanjay, Yu, Tianhua, Deng, Ruopeng, Ba, Xiaolan, Ermez, Sema
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Described herein are methods of filling features with tungsten and related apparatus. The methods described herein involve deposition of a tungsten nucleation layer prior to deposition of a bulk layer. The methods involve multiple atomic layer deposition (ALD) cycles. According to various embodiments, both a boron-containing reducing agent and silicon-reducing agent may be pulses during a single cycle to react with a tungsten-containing precursor and form a tungsten film.