Molybdenum deposition

Provided herein are low resistance metallization stack structures for logic and memory applications and related methods of fabrication. The methods involve forming bulk conductive films on thin low resistivity transition metal layers that have large grain size. The bulk conductive films follow the g...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Danek, Michal, Thombare, Shruti Vivek, Van Cleemput, Patrick A
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Provided herein are low resistance metallization stack structures for logic and memory applications and related methods of fabrication. The methods involve forming bulk conductive films on thin low resistivity transition metal layers that have large grain size. The bulk conductive films follow the grains of the low resistivity transition metal films, resulting in large grain size. Also provided are devices including template layers and bulk films.