Testing operations for memory systems

Methods, systems, and devices for testing operations for memory systems are described. A memory system may include a first circuit and a second circuit configured to test one or more counters tracking the quantity of activates to respective rows of memory cells. In some examples, the memory system m...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Ayyapureddi, Sujeet V, He, Yuan
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!