Selective silicon etch for gate all around transistors

Horizontal gate-all-around devices and methods of manufacturing same are described. The hGAA devices comprise a trimmed semiconductor material between source regions and drain regions of the device. The method includes selectively isotropically etching semiconductor material layers between source re...

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Bibliographische Detailangaben
Hauptverfasser: Kim, Myungsun, Natarajan, Sanjay, Colombeau, Benjamin, Stolfi, Michael
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Horizontal gate-all-around devices and methods of manufacturing same are described. The hGAA devices comprise a trimmed semiconductor material between source regions and drain regions of the device. The method includes selectively isotropically etching semiconductor material layers between source regions and drain regions of an electronic device.