In-situ monitoring system assisted material and parameter development for additive manufacturing

According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherei...

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Bibliographische Detailangaben
Hauptverfasser: Ping, Xiaohu, Gupta, Vipul Kumar, Dial, Laura Cerully, Roychowdhury, Subhrajit, Chennimalai Kumar, Natarajan, Hanlon, Timothy, Salasoo, Lembit, Vinciquerra, Anthony Joseph, Gambone, Justin John, Dheeradhada, Voramon Supatarawanich
Format: Patent
Sprache:eng
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Zusammenfassung:According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided.