System and method for marking substrates within improved line recovery time

A system having a plurality of marking and/or coding devices and a computing system coupled to the devices and having processor configured to: receive sensor data associated with each device; and store printer metadata and batch job metadata in a backup file for each device. The processor is configu...

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Bibliographische Detailangaben
Hauptverfasser:	Folkers, John P, Weaver, Robert, Susi, Fred, Smith, Robert
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A system having a plurality of marking and/or coding devices and a computing system coupled to the devices and having processor configured to: receive sensor data associated with each device; and store printer metadata and batch job metadata in a backup file for each device. The processor is configured to classify a fault condition of a respective one device based on one or more of received sensor data, device self-test data, current operational data and historical device condition data. The processor is configured to determine autonomously a repair process recommendation in response to the classified fault condition and based on an estimated time to repair (ETR) the device using a self-repair recovery process relative to a line recovery time (LRT) threshold. The processor is configured to recommend as the repair process recommendation the self-repair recovery process in response to the ETR being less than or equal to the LRT threshold.