Methods, systems, and devices for electrode capacitance calculation and application

The double layer capacitance of a working electrode of a sensor may be measured with minimal disruption to the sensor equilibrium by open circuiting the working electrode and measuring the voltage drift on a periodic, or as-needed, basis. The values of the double layer capacitance may be monitored o...

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Bibliographische Detailangaben
1. Verfasser: Morgan, Wayne A
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The double layer capacitance of a working electrode of a sensor may be measured with minimal disruption to the sensor equilibrium by open circuiting the working electrode and measuring the voltage drift on a periodic, or as-needed, basis. The values of the double layer capacitance may be monitored over time to determine, e.g., sensor age and condition.