Microelectromechanical systems ("MEMS") device having a built-in self-test ("BIST") and a method of application of a BIST to measure MEMS health

A microelectromechanical systems (MEMS) device includes a MEMS die and an electrical circuit electrically connected to the MEMS die. The electrical circuit includes a first capacitor that produces a first output signal based on a signal received from the MEMS die, and a second capacitor that produce...

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Bibliographische Detailangaben
Hauptverfasser: Grilo, Jorge, Albers, John J
Format: Patent
Sprache:eng
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Zusammenfassung:A microelectromechanical systems (MEMS) device includes a MEMS die and an electrical circuit electrically connected to the MEMS die. The electrical circuit includes a first capacitor that produces a first output signal based on a signal received from the MEMS die, and a second capacitor that produces a second output signal based on a signal received from the MEMS die. The electrical circuit is configured to determine a nominal capacitance of the MEMS die based on a ratio of the first output signal to the second output signal and a ratio of the capacitances of the first and second capacitors.